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Noise Measurement

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9812E

Compact Low Frequency Noise Measurement System

Noise Measurement 1/f Noise & RTN Mass Noise Testing

Primarius 9812E is a compact version of the industry's de-facto standard flicker noise (1/f noise) measurement systems 9812DX. 

  • Supports different measurement requirements for flicker noise and random/signaling telegraph noise (RTN or RTS)

  • Delivers significant and innovative improvement in system hardware and software design

  • Used with Primarius semiconductor parameter testing system FS-Pro, providing a parallel testing framework solution that significantly improves testing efficiency and throughput


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Highlights

  • High Resolution

    Multiple built-in LNAs
    wide impedance matching range

  • Full Coverage

    MOSFET, SOI, FinFET, TFT, HV/LDMOS, BJT/HBT,
    JFET, Diode, Resistor, Packaged IC, etc.

  • Parallel Testing

    Significantly improves
    testing efficiency & throughput

  • High Speed

    60 sec/bias for typical device 1/f noise

  • Wide Range

    Wide voltage/current/impedance range

  • Cost Effective

    Superior quality with competitive cost

Applications

  • Process/device evaluation for
    advanced IC design

  • Process
    evaluation
    & monitoring

  • Noise characterization for semiconductor device research

  • Noise characterization for SPICE model extraction

Technical Documents

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