Advanced Wide Bandwidth Noise Analyzer
Maximum testing bandwidth up to 0.03Hz~100MHz, supporting test applications spanning from ultra-low frequencies to very high frequencies.
Built-in application-oriented amplifiers features seamless switching design that offers extreme performance for various voltage noise tests and current noise tests.
A wide coverage of operation conditions and impedance range supporting wafer-level high precision and wide bandwidth testing.
1/f parallel testing and RTN parallel testing enhance testing efficiency.
Widely used for test applications required from semiconductor laboratories to manufacture users, particularly for thermal noise assessment in the very-high-frequency range and noise characteristic evaluation of RF devices.
0.03Hz–100MHz range
for ultra-low to VHF
noise testing
Minimum DC accuracy: 10pA
System noise current resolution @ VHF:
<10-23 A2/Hz
System noise current resolution:
<10-27 A2/Hz
20 sec/bias
for typical device
1/f noise measurement
Parallel testing
significantly improves
testing efficiency & throughput
Supports wafer-level
VHF thermal noise and
RF device evaluation
Pre-built test libraries
and intuitive GUI
streamline analysis workflows
1/f & RTN & thermal
noise characterization
for SPICE
model extraction
Process development
quality assessment
& quality control
Design
performance
optimization
Semiconductor
physics
& materials research