All-In-One Semiconductor Parameter Analyzer
Applies in almost all low frequency device characteristics measurement
Supports multi-channel parallel testing
Adopts PXI modular architecture to ensure compact size and extensibility
Built-in professional testing software LabExpress with rich test presets and powerful functions for typical parameters test, reliability test
Wide applications for semiconductor devices, LED materials, two-dimensional materials, nano-materials, and novel devices
Supporting high precision IV, CV,
pulse IV, transient IV sampling
and 1/f noise test
Wide range and high precision
high-speed sampling time-domain signal acquisition
arbitrary linear waveform generation
Over 100 customers worldwide
including top design companies, foundries, IDMs, universities, and research institutions
Enabling test configuration
flexibility & extensibility
Build-in LabExpress software
intuitive GUI for powerful measurement & analysis
Seamlessly integrated with
981X system & NoiseProPlus software
Process development
& device parameter testing
Semiconductor device
reliability
test
Semiconductor device
ultrashort pulse
testing
Non-destructive measurement
& inspection
Opto-electronic device
& MEMS measurement
2D materials
device testing
Metal
testing
Advanced materials
and device testing